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Proceedings Paper

Fabrication and characterization of large area mercuric iodide polycrystalline films
Author(s): Jianbao Gui; Jinchuan Guo; Qinlao Yang; Xufang Liu; Hanben Niu
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Paper Abstract

Mercuric iodide (HgI2) polycrystalline films are being developed as a new photoconductor layer for direct converter X-ray imaging detector. A physical vapor deposition (PVD) device for HgI2 deposition was developed specially. Depending on the device and low purity (99.5%) low-cost HgI2 source material, polycrystalline HgI2 films have been grown with dimensions Φ130 mm in diameter onto ITO-coated glass substrate. The grown techniques used can be easily extended to produce much larger films areas and the thickness of the grown layers, size of the grains and crystallinity can be regulated in a controlled way by adjusting the growth parameters. The basic physical characteristic, dark current and response characteristic to X-ray for the grown polycrystalline film were tested and the results show that the film has preferred crystalline orientation (00l), low dark current density less than 10 pA/mm2, high volume resistivity in the order of 1013 Ω•cm and high X-ray response sensitivity of about 16 μC/(cm2R), and the results put HgI2 polycrystalline films in position as a leading candidate material for use in digital X-ray imaging system.

Paper Details

Date Published: 29 November 2007
PDF: 8 pages
Proc. SPIE 6833, Electronic Imaging and Multimedia Technology V, 68332H (29 November 2007); doi: 10.1117/12.755851
Show Author Affiliations
Jianbao Gui, Huazhong Univ. of Science and Technology (China)
Shenzhen Univ. (China)
Jinchuan Guo, Shenzhen Univ. (China)
Qinlao Yang, Shenzhen Univ. (China)
Xufang Liu, Shenzhen Univ. (China)
Hanben Niu, Shenzhen Univ. (China)

Published in SPIE Proceedings Vol. 6833:
Electronic Imaging and Multimedia Technology V
Liwei Zhou; Chung-Sheng Li; Minerva M. Yeung, Editor(s)

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