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Proceedings Paper

A method of improving the accuracy of sub-pixel localization in digital image measurement
Author(s): Jianwei Zhang; Qiheng Zhang
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Paper Abstract

Using the local modeling method can get sub-pixel localization in digital image measurement, in order to improve the precision of sub-pixel measurement which is usually obtained by computing the properties of fitting curves in local modeling method, an effective method is presented. The proposed method is that at first using bilinear interpolation or other more reasonable interpolation ways to original image obtains a new image and then some edge features are extracted from the new image by chain code edge detection or other ways. Due to using of interpolation, after the pixels of extracted edge features are mapped to original image size, the edge features will contain more pixels which belong to integer pixels from original image and the sub-pixels which the interpolation image produces, subsequently those pixels will be used to fit curve to improve the accuracy of the fitting. According to the result of the improving fitting, a more accurate measurement is obtained by utilizing the properties of the curves. At the last section of this paper, the proposed method is evaluated by using real images which is collected by digital camera, the experiment result turns out that the algorithm owns better accuracy than the one which is only by only fitting on account of the proposed method which owns better standard deviation than the only fitting way without interpolation.

Paper Details

Date Published: 29 November 2007
PDF: 8 pages
Proc. SPIE 6833, Electronic Imaging and Multimedia Technology V, 68332C (29 November 2007); doi: 10.1117/12.755737
Show Author Affiliations
Jianwei Zhang, Institute of Optics and Electronics (China)
Graduate School of Chinese Academy of Sciences (China)
Qiheng Zhang, Institute of Optics and Electronics (China)

Published in SPIE Proceedings Vol. 6833:
Electronic Imaging and Multimedia Technology V
Liwei Zhou; Chung-Sheng Li; Minerva M. Yeung, Editor(s)

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