Share Email Print
cover

Proceedings Paper

Simulation of the phase-shift and anti-vibration in wavefront time-domain algorithm
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The wavefront time-domain detection algorithm is a simple, practical and low-cost interferometry method, which can be adapted to all kinds of outside noise and achieve high accuracy in interferometric measurement on optical components and systems. For further understanding the wavefront time-domain measurement of anti-jamming capability and accuracy of interferometry, the simulation is presented of time-domain sampling frequency of interferograms, external vibration frequency and amplitude, and harmonic effect, etc. in this paper. This algorithm makes the measurement controlled by means of using the environment vibration and air turbulence as phase shifters, simply with assistance of active phase shifting. Acquiring adequate interferograms to calculate the phase value of each point, we can obtain the stable wave surface wiping off random vibration and air turbulence by the unwrapping and average calculation. In this process, by changing the time-domain sampling frequency, external vibration frequency and amplitude in the simulation, the relationships among them can be obtained. The appropriate sampling frequency could be chosen according to the conditions of actual measurement to ensure the accuracy and stability of measurement. According to statistical analysis, this algorithm enhance its ability of anti-jamming, and improve the adaptability and especially for the real-time detection of large aperture mirror.

Paper Details

Date Published: 28 November 2007
PDF: 9 pages
Proc. SPIE 6834, Optical Design and Testing III, 68342A (28 November 2007); doi: 10.1117/12.755622
Show Author Affiliations
Lei Tang, Beijing Institute of Technology (China)
Qun Hao, Beijing Institute of Technology (China)
Qiudong Zhu, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 6834:
Optical Design and Testing III
Yongtian Wang; Theo T. Tschudi; Jannick P. Rolland; Kimio Tatsuno, Editor(s)

© SPIE. Terms of Use
Back to Top