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Proceedings Paper

An active zooming method for simultaneous control of field-of-view and depth-of-field in vision-based microassembly
Author(s): Xiaodong Tao; Farrokh Janabi-Sharifi; Hyungsuck Cho
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Paper Abstract

Vision-based techniques used in automatic microassembly are limited by inherent problems such as small depth of focus (DOF) and field of view (FOV). Microassembly operations need, however, initially to detect micro parts in a wide FOV and large DOF yet to maintain high resolution for the final state. This paper proposes an active zooming control method that enables adjustment of the FOV and DOF dynamically according to the position and focus measure of micro objects. The proposed method is based on an artificial potential field with the capability to combine different kinds of constraints such as the FOV, focus measure, and joint limits, into the system. The proposed method can ensure the microscopy to maintain a wide FOV and large DOF initially, and high resolution at the end. Simulation and microassembly experimental results are provided to verify feasibility of the proposed approach.

Paper Details

Date Published: 8 October 2007
PDF: 9 pages
Proc. SPIE 6719, Optomechatronic Systems Control III, 671904 (8 October 2007); doi: 10.1117/12.754579
Show Author Affiliations
Xiaodong Tao, Korea Advanced Institute of Science and Technology (South Korea)
Farrokh Janabi-Sharifi, Ryerson Univ. (Canada)
Hyungsuck Cho, Korea Advanced Institute of Science and Technology (South Korea)

Published in SPIE Proceedings Vol. 6719:
Optomechatronic Systems Control III
Sergej Fatikow; Farrokh Janabi-Sharifi; Toshio Fukuda; Hyungsuck Cho; Heikki N. Koivo, Editor(s)

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