Share Email Print
cover

Proceedings Paper

Digital holography microscopy (DHM) operating in pulsed stroboscopic mode: a versatile metrology instrument for micro and nano technology
Author(s): Frédéric Montfort; François Marquet; Etienne Cuche; Nicolas Aspert; Eduardo Solanas; Yves Emery; Christian Depeursinge
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Process engineering and failure analysis of MEMS and MOEMS require static and dynamical characterization of both their in-plane and out of plane response to an excitation. A remarkable characteristic of Digital Holography Microscopes (DHM) is the extremely short acquisition time required to grab the whole information necessary to provide 3D optical topography of the sample: a unique frame grab, without any vertical or lateral scan provides the information over the full field of view. First, it ensures DHM measurements to be insensitive to vibrations. Second, it opens the door to fast dynamical characterization of micro-systems. For periodic movement analysis, DHM can operate in two stroboscopic modes with standard cameras. The first one enables precise characterization up to excitation frequencies of 100 kHz with recovery cycle of 10% simply by triggering properly the camera. The second one uses a pulsed source for investigation of higher excitation frequencies. For non periodic movement analysis fast acquisition cameras and postponed treatment are used. DHM are therefore unique and very efficient tool for dynamical characterization of in‐plane and out-of-plane response. In this paper we illustrate the two stroboscopic modes with an example of a high frequency micro mirror.

Paper Details

Date Published: 10 October 2007
PDF: 7 pages
Proc. SPIE 6716, Optomechatronic Sensors and Instrumentation III, 671605 (10 October 2007); doi: 10.1117/12.754176
Show Author Affiliations
Frédéric Montfort, Lyncée Tec SA (Switzerland)
François Marquet, Lyncée Tec SA (Switzerland)
Etienne Cuche, Lyncée Tec SA (Switzerland)
Nicolas Aspert, Lyncée Tec SA (Switzerland)
Eduardo Solanas, Lyncée Tec SA (Switzerland)
Yves Emery, Lyncée Tec SA (Switzerland)
Christian Depeursinge, STI-IOA, EPFL (Switzerland)


Published in SPIE Proceedings Vol. 6716:
Optomechatronic Sensors and Instrumentation III

© SPIE. Terms of Use
Back to Top