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Proceedings Paper

Multi-alkali photocathode thermal performance analysis of image intensifier based on low-high temperature environment testing conditions
Author(s): Youtang Gao; Si Tian; Benkang Chang; Yafeng Qiu; Jianliang Qiao
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Paper Abstract

Low-level-light (LLL) weapon sight measurement technologies based on Low-high temperature environments testing conditions are always concerned by military equipments manufacturers. Because low-high temperature environment, etc. are under loaded function, the electric performance parameter change to make LLL weapon sight, causing the LLL weapon sight can't be worked and used normally while taking aim. Generally believed that many photocathode is n-type and p-type doping of the inner surface layer comprising more photocathode not light sensitive, but also sensitive to temperature. To image intensifier is non-working state at the temperature 70°C ±2°C test boxes and thermostats time one hour, five minutes to image intensifier into -50°C±2°C Test Box temperature one hour, then five minutes again placed 70°C ±2°C high temperature test box for three cycle question image intensifier restore normal temperature after the test. The experiments show that, when the temperature rises, the heat semiconductor photocathode current density, thermal current rise in the temperature range 0 to 70°C, 4°C temperature is increased, almost twice its current heat. Of course, image intensifier imported the equivalent background illumination will also increase, resulting in night vision systems observed at the scene image contrast and differential rates were lowered, target detection system performance last night caused the decline. A study of the reasons is the photo-cathode materials and fabrication of thermal electron emission standards restricting the ability.

Paper Details

Date Published: 28 November 2007
PDF: 6 pages
Proc. SPIE 6834, Optical Design and Testing III, 68341V (28 November 2007); doi: 10.1117/12.753984
Show Author Affiliations
Youtang Gao, NanYang Institute of Technology (China)
NanJing Univ. of Science and Technology (China)
Si Tian, NanYang Institute of Technology (China)
NanJing Univ. of Science and Technology (China)
Benkang Chang, NanYang Institute of Technology (China)
Yafeng Qiu, NanYang Institute of Technology (China)
Jianliang Qiao, NanYang Institute of Technology (China)
NanJing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 6834:
Optical Design and Testing III
Yongtian Wang; Theo T. Tschudi; Jannick P. Rolland; Kimio Tatsuno, Editor(s)

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