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Proceedings Paper

Comparing low coherence interferometry with conventional methods of measuring paper roughness
Author(s): Tuukka Prykäri; Erkki Alarousu; Risto Myllylä
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Paper Abstract

This paper introduces optical non-contact paper surface characterization based on Low Coherence Interferometry (LCI). Using this technique, the roughness of two different types of fine paper series are measured and the obtained results are compared to those of two air leak methods, PPS and Bendtsen, which are used as reference methods.

Paper Details

Date Published: 20 June 2007
PDF: 5 pages
Proc. SPIE 6536, Saratov Fall Meeting 2006: Coherent Optics of Ordered and Random Media VII, 65360O (20 June 2007); doi: 10.1117/12.753459
Show Author Affiliations
Tuukka Prykäri, Univ. of Oulu (Finland)
Erkki Alarousu, Univ. of Oulu (Finland)
Risto Myllylä, Univ. of Oulu (Finland)


Published in SPIE Proceedings Vol. 6536:
Saratov Fall Meeting 2006: Coherent Optics of Ordered and Random Media VII

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