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Proceedings Paper

Femtosecond laser surface ablation of transparent solids: understanding the bulk filamentation damage
Author(s): Sergey I. Kudryashov; A. Joglekar; G. Mourou; A. A. Ionin; V. D. Zvorykin; A. J. Hunt
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Paper Abstract

Direct SEM examination reveals a complex nanoscale structure of deep narrow central channels within shallow wide external craters produced by single-shot high-intensity femtosecond laser radiation on Corning 0211 glass and sapphire surfaces. These internal narrow channels are not expected from ordinary surface melt spallation and expulsion processes characteristic of the external surface nanocraters, but exhibit nearly the same appearance threshold. Surprisingly, the nanochannel radiuses rapidly saturate versus incident laser intensity indicating bulk rather than surface character of laser energy deposition, in contrast to the external craters extending versus laser intensity in a regular manner. These facts may be explained by channeling of electromagnetic radiation by near-surface ablative filamentary propagation of intense femtosecond laser pulses in the highly electronically excited dielectrics, by spherical aberrations in the surface layer, or deep drilling of the samples by short-wavelength Bremsstrahlung radiation of relatively hot surface electron-hole or electron-ion plasma. The double structure of ablated surface nano-features is consistent with similar structures observed for bulk damage features fabricated by femtosecond laser pulses at supercritical laser powers, but much lower laser intensities.

Paper Details

Date Published: 9 July 2007
PDF: 9 pages
Proc. SPIE 6733, International Conference on Lasers, Applications, and Technologies 2007: Environmental Monitoring and Ecological Applications; Optical Sensors in Biological, Chemical, and Engineering Technologies; and Femtosecond Laser Pulse Filamentation, 67332H (9 July 2007); doi: 10.1117/12.753155
Show Author Affiliations
Sergey I. Kudryashov, P.N. Lebedev Physical Institute (Russia)
A. Joglekar, Univ. of North Carolina at Chapel Hill (United States)
G. Mourou, Lab. d'Optique Appliquée, ENSTA, Ecole Polytechnique (France)
A. A. Ionin, P.N. Lebedev Physical Institute (Russia)
V. D. Zvorykin, P.N. Lebedev Physical Institute (Russia)
A. J. Hunt, Univ. of Michigan (United States)


Published in SPIE Proceedings Vol. 6733:
International Conference on Lasers, Applications, and Technologies 2007: Environmental Monitoring and Ecological Applications; Optical Sensors in Biological, Chemical, and Engineering Technologies; and Femtosecond Laser Pulse Filamentation

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