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Proceedings Paper

The relationship between laser fluence profile and the cumulative probability of damage curve
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Paper Abstract

The Gaussian profile beam has been de rigeur for damage threshold measurements for decades. This paper formulates the cumulative probability of damage (CPD) curve for the Gaussian and an arbitrary distribution of defects in fluence (intensity) space. It is seen that the CPD for the Gaussian is relatively insensitive to the underlying distribution of defects. The CPD is reformulated for a flat top distribution and shown to be far more influenced by the underlying defect distribution. The paper concludes with a discussion of the relationship between the defect distribution, sample size, threshold and measured threshold, for both the Gaussian and flat top profiles. It will be shown than the CPD for Gaussian beams increases with increasing fluence regardless of the distributions of the defects in fluence. The Flat Top CPD will only increase with increasing defect density.

Paper Details

Date Published: 20 December 2007
PDF: 10 pages
Proc. SPIE 6720, Laser-Induced Damage in Optical Materials: 2007, 672011 (20 December 2007); doi: 10.1117/12.753054
Show Author Affiliations
Jonathan W. Arenberg, Northrop Grumman Corp. (United States)


Published in SPIE Proceedings Vol. 6720:
Laser-Induced Damage in Optical Materials: 2007
Gregory J. Exarhos; Arthur H. Guenther; Keith L. Lewis; Detlev Ristau; M. J. Soileau; Christopher J. Stolz, Editor(s)

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