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Proceedings Paper

Comparison of Gaussian and top-hat beam profiles in LIDT testing
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Paper Abstract

The ISO 11254 standard for LIDT tests suggests two possible spatial beam profiles for damage testing. Accordingly, an equal set of samples was tested with a Gaussian TEM00 as well as with a top-hat beam profile at different beam diameters. It was found that for the investigated HfO2/SiO2 high reflectors there was no threshold dependence on the beam diameter at 355nm. The damage threshold values measured with the Gaussian and the top-hat beam were in good correlation.

Paper Details

Date Published: 20 December 2007
PDF: 8 pages
Proc. SPIE 6720, Laser-Induced Damage in Optical Materials: 2007, 672013 (20 December 2007); doi: 10.1117/12.752873
Show Author Affiliations
L. Jensen, Laser Zentrum Hannover e.V. (Germany)
M. Jupe, Laser Zentrum Hannover e.V. (Germany)
K. Starke, Laser Zentrum Hannover e.V. (Germany)
D. Ristau, Laser Zentrum Hannover e.V. (Germany)
W. Riede, German Aerospace Ctr. (Germany)
P. Allenspacher, German Aerospace Ctr. (Germany)

Published in SPIE Proceedings Vol. 6720:
Laser-Induced Damage in Optical Materials: 2007
Gregory J. Exarhos; Arthur H. Guenther; Keith L. Lewis; Detlev Ristau; M. J. Soileau; Christopher J. Stolz, Editor(s)

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