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Proceedings Paper

Fluorescence monitoring of organic deposits
Author(s): H. Schröder; S. Becker; Y. Lien; W. Riede; D. Wernham
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Paper Abstract

In this paper, we present the continued joint effort of ESA/ESTEC and DLR laser laboratories of improving the fluorescence monitoring technique towards a quantitative means for analysis of UV laser-induced deposit formation on optical samples in vacuum. In addition, a separate low power UV fluorescence excitation light source was implemented into the system allowing the investigation of laser-induced deposition occurring during irradiation of optics with IR and VIS light beams.

Paper Details

Date Published: 20 December 2007
PDF: 9 pages
Proc. SPIE 6720, Laser-Induced Damage in Optical Materials: 2007, 67200O (20 December 2007); doi: 10.1117/12.752866
Show Author Affiliations
H. Schröder, German Aerospace Center (DLR) (Germany)
S. Becker, ESA-ESTEC (Netherlands)
Y. Lien, ESA-ESTEC (Netherlands)
W. Riede, German Aerospace Center (DLR) (Germany)
D. Wernham, ESA-ESTEC (Netherlands)

Published in SPIE Proceedings Vol. 6720:
Laser-Induced Damage in Optical Materials: 2007
Gregory J. Exarhos; Arthur H. Guenther; Keith L. Lewis; Detlev Ristau; M. J. Soileau; Christopher J. Stolz, Editor(s)

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