Share Email Print

Proceedings Paper

Fluorescence monitoring of organic deposits
Author(s): H. Schröder; S. Becker; Y. Lien; W. Riede; D. Wernham
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In this paper, we present the continued joint effort of ESA/ESTEC and DLR laser laboratories of improving the fluorescence monitoring technique towards a quantitative means for analysis of UV laser-induced deposit formation on optical samples in vacuum. In addition, a separate low power UV fluorescence excitation light source was implemented into the system allowing the investigation of laser-induced deposition occurring during irradiation of optics with IR and VIS light beams.

Paper Details

Date Published: 20 December 2007
PDF: 9 pages
Proc. SPIE 6720, Laser-Induced Damage in Optical Materials: 2007, 67200O (20 December 2007); doi: 10.1117/12.752866
Show Author Affiliations
H. Schröder, German Aerospace Center (DLR) (Germany)
S. Becker, ESA-ESTEC (Netherlands)
Y. Lien, ESA-ESTEC (Netherlands)
W. Riede, German Aerospace Center (DLR) (Germany)
D. Wernham, ESA-ESTEC (Netherlands)

Published in SPIE Proceedings Vol. 6720:
Laser-Induced Damage in Optical Materials: 2007
Gregory J. Exarhos; Arthur H. Guenther; Keith L. Lewis; Detlev Ristau; M. J. Soileau; Christopher J. Stolz, Editor(s)

© SPIE. Terms of Use
Back to Top