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Proceedings Paper

A biphase scheme for edge detection
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Paper Abstract

A new simple and efficient scheme for edge detection is presented. Its first property is to localize correctly edges in sharp images. The ability of the method to strongly reduce any noise is demonstrated. Its performances are also established in the case of the gaussian white noise. The multiresolution version of this method is introduced: it will be developed in a future work.

Paper Details

Date Published: 4 October 2007
PDF: 8 pages
Proc. SPIE 6763, Wavelet Applications in Industrial Processing V, 67630Z (4 October 2007); doi: 10.1117/12.752754
Show Author Affiliations
O. Laligant, Univ. de Bourgogne (France)
F. Truchetet, Univ. de Bourgogne (France)


Published in SPIE Proceedings Vol. 6763:
Wavelet Applications in Industrial Processing V
Frédéric Truchetet; Olivier Laligant, Editor(s)

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