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Proceedings Paper

Form-birefringence simulation: different approaches comparison
Author(s): Andrey A. Lutich
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Paper Abstract

In this paper we compare different effective medium approximations that are widely used for refractive index and birefringence simulation in 2d nanostructures with plane-wave expansion approach which is considered and proved to be absolutely correct. It is estimated independence of the result of extraordinary refractive index (for TM-polarization) simulation on the method. Calculations carried out for model porous alumina film demonstrate the best agreement between results of plane-wave expansion method and Maxwell-Garnett theory. For Bruggeman approximation and Boundary conditions model applicability regions have been clarified at the porosity scale.

Paper Details

Date Published: 31 July 2007
PDF: 6 pages
Proc. SPIE 6728, ICONO 2007: Novel Photonics Materials; Optics and Optical Diagnostics of Nanostructures, 67283H (31 July 2007); doi: 10.1117/12.752474
Show Author Affiliations
Andrey A. Lutich, Institute of Molecular and Atomic Physics (Belarus)


Published in SPIE Proceedings Vol. 6728:
ICONO 2007: Novel Photonics Materials; Optics and Optical Diagnostics of Nanostructures

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