Share Email Print

Proceedings Paper

PMD tolerance testing of optical interfaces
Author(s): Harald Rosenfeldt
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Improving the tolerance to polarization mode dispersion (PMD) is considered to be one of the major prerequisites for the success of modern high bit rate optical communication systems. Various approaches such as optical compensation, electrical mitigation, multi-level modulation formats promise to increase the PMD tolerance of optical systems, whereas the question of how to experimentally characterize these solutions needs to be answered before commercial deployment. This is not an easy task since these systems need to be characterized with respect to first and higher order PMD but also with respect to their dynamic behavior. We show that deterministic polarization controllers combined with in-situ measurement of PMD can help to explore the PMD tolerance of an optical communication system and to generate reliable and repeatable results by avoiding statistical elements such as polarization scramblers. These elements can be combined to form a PMD testbed which allows to stress a system by applying a deterministic amount of PMD including a well-defined rate of change. Such a PMD testbed can be used during development of adaptive mitigators as well as for compliance testing. Finding an agreement on standard test procedures for such a testbed will make the evaluation of PMD tolerant receivers easier and more comparable.

Paper Details

Date Published: 10 September 2007
PDF: 8 pages
Proc. SPIE 6774, Optical Transmission Systems and Equipment for Networking VI, 67740F (10 September 2007); doi: 10.1117/12.752199
Show Author Affiliations
Harald Rosenfeldt, Agilent Technologies (Germany)

Published in SPIE Proceedings Vol. 6774:
Optical Transmission Systems and Equipment for Networking VI
Werner Weiershausen; Benjamin B. Dingel; Achyut Kumar Dutta; Ken-ichi Sato, Editor(s)

© SPIE. Terms of Use
Back to Top