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Proceedings Paper

Method of detecting of thin-film coating thickness by means of 0.63-μ laser radiation
Author(s): V. P. Osipov; V. N. Chijevski; D. V. Shabrov
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Paper Abstract

It is described the express optical method of evaluation of thin-film coatings, deposited on metal or semiconductor surface. For the tested samples of enamel-covered duralumin it is found the linear dependence of maximal intensity and half-width of secondary radiation on the thickness of the coating.

Paper Details

Date Published: 28 June 2007
PDF: 4 pages
Proc. SPIE 6732, International Conference on Lasers, Applications, and Technologies 2007: Laser-assisted Micro- and Nanotechnologies, 673213 (28 June 2007); doi: 10.1117/12.751941
Show Author Affiliations
V. P. Osipov, Stepanov Institute of Physics (Belarus)
V. N. Chijevski, Stepanov Institute of Physics (Belarus)
D. V. Shabrov, Stepanov Institute of Physics (Belarus)


Published in SPIE Proceedings Vol. 6732:
International Conference on Lasers, Applications, and Technologies 2007: Laser-assisted Micro- and Nanotechnologies

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