Share Email Print

Proceedings Paper

Variety identification of brown sugar using short-wave near infrared spectroscopy and multivariate calibration
Author(s): Haiqing Yang; Di Wu; Yong He
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Near-infrared spectroscopy (NIRS) with the characteristics of high speed, non-destructiveness, high precision and reliable detection data, etc. is a pollution-free, rapid, quantitative and qualitative analysis method. A new approach for variety discrimination of brown sugars using short-wave NIR spectroscopy (800-1050nm) was developed in this work. The relationship between the absorbance spectra and brown sugar varieties was established. The spectral data were compressed by the principal component analysis (PCA). The resulting features can be visualized in principal component (PC) space, which can lead to discovery of structures correlative with the different class of spectral samples. It appears to provide a reasonable variety clustering of brown sugars. The 2-D PCs plot obtained using the first two PCs can be used for the pattern recognition. Least-squares support vector machines (LS-SVM) was applied to solve the multivariate calibration problems in a relatively fast way. The work has shown that short-wave NIR spectroscopy technique is available for the brand identification of brown sugar, and LS-SVM has the better identification ability than PLS when the calibration set is small.

Paper Details

Date Published: 15 November 2007
PDF: 6 pages
Proc. SPIE 6788, MIPPR 2007: Pattern Recognition and Computer Vision, 67882T (15 November 2007); doi: 10.1117/12.751332
Show Author Affiliations
Haiqing Yang, Zhejiang Univ. (China)
Zhejiang Univ. of Technology (China)
Di Wu, Zhejiang Univ. (China)
Yong He, Zhejiang Univ. (China)

Published in SPIE Proceedings Vol. 6788:
MIPPR 2007: Pattern Recognition and Computer Vision
S. J. Maybank; Mingyue Ding; F. Wahl; Yaoting Zhu, Editor(s)

© SPIE. Terms of Use
Back to Top