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Proceedings Paper

Polarization scattering from a Spectralon calibration sample
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Paper Abstract

The in-plane Mueller matrix bidirectional reflectance distribution function (MMBRDF) is measured for a Spectralon calibration target with a reflectance of 99%. Measurements are acquired using a Mueller matrix active imaging, goniometric polarimeter operated in the near infrared at 1550nm. The Spectralon is measured for both incident and scattering angles from -80 degrees to 80 degrees to within 20 degrees of retro-reflection. A range of polarization states is generated and scattered polarization states are analyzed by means of a dual rotating retarder Mueller matrix polarimeter. Complete Mueller matrix data is measured with a high-resolution camera in image form. Polarization scatter data is presented in Mueller matrix angular arrays. As expected the Spectralon is a strong depolarizer and weak s-plane oriented diattenuator. It was also a weak retarder. Diattenuation and retardance are strongest at horizontal and vertical polarizations, and weakest for circular polarization states.

Paper Details

Date Published: 13 September 2007
PDF: 9 pages
Proc. SPIE 6682, Polarization Science and Remote Sensing III, 668219 (13 September 2007); doi: 10.1117/12.747483
Show Author Affiliations
Hannah Noble, College of Optical Sciences, The Univ. of Arizona (United States)
Wai-Sze Tiffany Lam, College of Optical Sciences, The Univ. of Arizona (United States)
Greg Smith, College of Optical Sciences, The Univ. of Arizona (United States)
Stephen McClain, College of Optical Sciences, The Univ. of Arizona (United States)
Russell A. Chipman, College of Optical Sciences, The Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 6682:
Polarization Science and Remote Sensing III
Joseph A. Shaw; J. Scott Tyo, Editor(s)

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