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Proceedings Paper

Gated-mode integrated single photon detector for telecom wavelengths
Author(s): Qing-Lin Wu; Yun Liu; Zheng-Fu Han; Wei Chen; Yi-Min Dai; Guo Wei; Guang-Can Guo
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Paper Abstract

We have demonstrated a gated-mode single-photon detector at 1550 nm using two thermoelectrically cooled InGaAs/InP avalanche photodiodes (APDs). Balanced outputs from the two APDs were used to cancel the charge and discharge spikes, which were attributable to capacitive behavior in a gated mode. The avalanche signals were not attenuated during the spike cancellation, which enable one to reduce the bias voltage applied to the APDs and thus reduce the dark count probability. We obtained a quantum efficiency of 10.5% with a dark count probability of 4.8E-5 per gate at 212 K. A single photon detector module that integrated APD and all necessary circuits into a compact bin has been performed.

Paper Details

Date Published: 15 October 2007
PDF: 7 pages
Proc. SPIE 6771, Advanced Photon Counting Techniques II, 67711A (15 October 2007); doi: 10.1117/12.747007
Show Author Affiliations
Qing-Lin Wu, Univ. of Science and Technology of China (China)
Yun Liu, Univ. of Science and Technology of China (China)
Zheng-Fu Han, Univ. of Science and Technology of China (China)
Wei Chen, Univ. of Science and Technology of China (China)
Yi-Min Dai, Univ. of Science and Technology of China (China)
Guo Wei, Univ. of Science and Technology of China (China)
Guang-Can Guo, Univ. of Science and Technology of China (China)


Published in SPIE Proceedings Vol. 6771:
Advanced Photon Counting Techniques II
Wolfgang Becker, Editor(s)

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