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Proceedings Paper

Properties of x-ray Cherenkov radiation produced by charged particles in Si/Mo multilayers
Author(s): M. A. Aginian; L. A. Gevorgian; K. A. Ispirian; M. K. Ispiryan
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Paper Abstract

The angular-spectral distributions as well as the dependence of the total number of photons of X-ray Cherenkov radiation upon the number, thickness of the layers and on particle energy have been calculated using the theoretical formulae taking into account the reflection from the interfaces between the two media of the Si/Mo multilayers. The possibilities of the experimental investigation have been discussed.

Paper Details

Date Published: 2 May 2007
PDF: 7 pages
Proc. SPIE 6634, International Conference on Charged and Neutral Particles Channeling Phenomena II, 663414 (2 May 2007); doi: 10.1117/12.741931
Show Author Affiliations
M. A. Aginian, Yerevan Physics Institute (Armenia)
L. A. Gevorgian, Yerevan Physics Institute (Armenia)
K. A. Ispirian, Yerevan Physics Institute (Armenia)
M. K. Ispiryan, Yerevan Physics Institute (Armenia)


Published in SPIE Proceedings Vol. 6634:
International Conference on Charged and Neutral Particles Channeling Phenomena II

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