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Proceedings Paper

Refractive index measurement using comparative interferometry
Author(s): Mihaela Bojan; D. Apostol; V. Damian; P. C. Logofatu; F. Garoi; Iuliana Iordache
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Paper Abstract

The refractive index of a material medium is an important optical parameter since it exhibits the optical properties of the material. The adulteration problem is increasing day by day and hence simple, automatic and accurate measurement of the refractive index of materials is of great importance these days. For solid thin films materials Abeles method was reconsidered. Quick, measurements of refractive index using simple techniques and refractometers can help controlling adulteration of liquids of common use to a greater extent. Very simple interferometric set-up using Fizeau fringe patterns compares the fringe pitch as obtained in a cell with two levels: one down level with the unknown refractive index liquids and the upper level with gas air. A CCD matrix and a PC can handle the data and produce the results up to for digits.

Paper Details

Date Published: 8 May 2007
PDF: 5 pages
Proc. SPIE 6635, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies III, 66350Q (8 May 2007); doi: 10.1117/12.741908
Show Author Affiliations
Mihaela Bojan, National Institute for Lasers, Plasma and Radiation Physics (Romania)
D. Apostol, National Institute for Lasers, Plasma and Radiation Physics (Romania)
V. Damian, National Institute for Lasers, Plasma and Radiation Physics (Romania)
P. C. Logofatu, National Institute for Lasers, Plasma and Radiation Physics (Romania)
F. Garoi, National Institute for Lasers, Plasma and Radiation Physics (Romania)
Iuliana Iordache, National Institute for Lasers, Plasma and Radiation Physics (Romania)


Published in SPIE Proceedings Vol. 6635:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies III

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