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Proceedings Paper

Longwave infrared snapshot imaging spectropolarimeter
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Paper Abstract

A very unique imaging spectopolarimeter for use in the long wave infrared, 8 to 12 microns, is currently being constructed. The imaging system uses a novel technique first developed at the University of Arizona, which incorporates channeled spectropolarimetry with a computed tomographic imaging spectrometer (CTIS). The system is especially noteworthy because it contains no moving parts and operates in a snapshot mode, allowing it to record spectral data as well as the polarization state of each wavelength band in the spectra from every spatial location in a 2D image in a single integration period. The paper presents results from the currently constructed longwave infrared snapshot imaging spectrometer, as well as a description of what will be added to the system to obtain polarization data, and an overview of the design and operational details of the snapshot imaging spectropolarimeter.

Paper Details

Date Published: 12 September 2007
PDF: 8 pages
Proc. SPIE 6660, Infrared Systems and Photoelectronic Technology II, 666009 (12 September 2007); doi: 10.1117/12.741900
Show Author Affiliations
Riley W. Aumiller, College of Optical Sciences, The Univ. of Arizona (United States)
Eustace L. Dereniak, College of Optical Sciences, The Univ. of Arizona (United States)
Robert Sampson, I Technology Applications (United States)
Robert W. McMillan, U.S. Army Space and Missile Defense Command (United States)


Published in SPIE Proceedings Vol. 6660:
Infrared Systems and Photoelectronic Technology II
Eustace L. Dereniak; John P. Hartke; Randolph E. Longshore; Ashok K. Sood, Editor(s)

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