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Proceedings Paper

Enhancements of the Abelés method for refractive index determination
Author(s): Petre C. Logofatu; Iuliana M. Iordache; Mihaela M. Bojan
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Paper Abstract

The Abelès method is a classical method for determining the refractive index of dielectric thin films, based on the phenomenon oftotal transmission of p-polarized light at the Brewster angle ofincidence. In this paper we examined the main features of the method, such as the criterion for ruling out spurious solutions, in a formal manner, using closed form equations. We also investigated the method for ambiguities and we found out using rigorous analysis that the method is ambiguous, because there are unreported situations in which the spurious solutions cannot be distinguished from the real solution. The limits within which the method can be used, even in situations when ambiguities exist, are determined.

Paper Details

Date Published: 7 May 2007
PDF: 6 pages
Proc. SPIE 6635, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies III, 663507 (7 May 2007); doi: 10.1117/12.741865
Show Author Affiliations
Petre C. Logofatu, National Institute for Lasers, Plasma and Radiation Physics (Romania)
Iuliana M. Iordache, National Institute for Lasers, Plasma and Radiation Physics (Romania)
Mihaela M. Bojan, National Institute for Lasers, Plasma and Radiation Physics (Romania)


Published in SPIE Proceedings Vol. 6635:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies III

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