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Proceedings Paper

SWIR variable dispersion spectral imaging sensor
Author(s): F. D. Shepherd; J. M. Mooney; T. E. Reeves; D. S. Franco; J. E. Murguia; C. Wong; P. Dumont; F. Khaghani; G. Diaz; M. M. Weeks; D. Leahy
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Paper Abstract

A novel spectral imaging sensor based on dual direct vision prisms is described. The prisms project a spectral image onto the focal plane array of an infrared camera. The prism set is rotated on the camera axis and the resulting spectral information is extracted as an image cube (x, y, λ), using tomographic techniques. The sensor resolves more than 40 spectral bands (channels) at wavelengths between 1.2 μm and 2.5 μm wavelength. The sensor dispersion characteristic is determined by the vector sum of the dispersions of the two prisms. The number of resolved channels, and the related signal strength per channel, varies with the angle between the prism dispersion axes. This is a new capability for this class of spectral imaging sensor. Reconstructed short-wave imagery and spectral data is presented for field and laboratory scenes and for standard test sources.

Paper Details

Date Published: 12 September 2007
PDF: 6 pages
Proc. SPIE 6660, Infrared Systems and Photoelectronic Technology II, 66600J (12 September 2007); doi: 10.1117/12.740364
Show Author Affiliations
F. D. Shepherd, Solid State Scientific Corp. (United States)
J. M. Mooney, Solid State Scientific Corp. (United States)
T. E. Reeves, Solid State Scientific Corp. (United States)
D. S. Franco, Solid State Scientific Corp. (United States)
J. E. Murguia, Solid State Scientific Corp. (United States)
C. Wong, Solid State Scientific Corp. (United States)
P. Dumont, Solid State Scientific Corp. (United States)
F. Khaghani, Solid State Scientific Corp. (United States)
G. Diaz, Solid State Scientific Corp. (United States)
M. M. Weeks, Air Force Research Lab. (United States)
D. Leahy, Air Force Research Lab. (United States)


Published in SPIE Proceedings Vol. 6660:
Infrared Systems and Photoelectronic Technology II
Eustace L. Dereniak; John P. Hartke; Randolph E. Longshore; Ashok K. Sood, Editor(s)

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