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Proceedings Paper

Measurement of luminance noise and chromaticity noise of LCDs with a colorimeter and a color camera
Author(s): H. Roehrig; W. J. Dallas; E. A. Krupinski; Gary R. Redford
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Paper Abstract

This communication focuses on physical evaluation of image quality of displays for applications in medical imaging. In particular we were interested in luminance noise as well as chromaticity noise of LCDs. Luminance noise has been encountered in the study of monochrome LCDs for some time, but chromaticity noise is a new type of noise which has been encountered first when monochrome and color LCDs were compared in an ROC study. In this present study one color and one monochrome 3 M-pixel LCDs were studied. Both were DICOM calibrated with equal dynamic range. We used a Konica Minolta Chroma Meter CS-200 as well as a Foveon color camera to estimate luminance and chrominance variations of the displays. We also used a simulation experiment to estimate luminance noise. The measurements with the colorimeter were consistent. The measurements with the Foveon color camera were very preliminary as color cameras had never been used for image quality measurements. However they were extremely promising. The measurements with the colorimeter and the simulation results showed that the luminance and chromaticity noise of the color LCD were larger than that of the monochrome LCD. Under the condition that an adequate calibration method and image QA/QC program for color displays are available, we expect color LCDs may be ready for radiology in very near future.

Paper Details

Date Published: 18 October 2007
PDF: 10 pages
Proc. SPIE 6707, Penetrating Radiation Systems and Applications VIII, 67070V (18 October 2007); doi: 10.1117/12.740226
Show Author Affiliations
H. Roehrig, Univ. of Arizona (United States)
W. J. Dallas, Univ. of Arizona (United States)
E. A. Krupinski, Univ. of Arizona (United States)
Gary R. Redford, Optic Valley Photonics (United States)

Published in SPIE Proceedings Vol. 6707:
Penetrating Radiation Systems and Applications VIII
F. Patrick Doty; H. Bradford Barber; Hans Roehrig, Editor(s)

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