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Proceedings Paper

Fundamental performance differences between CMOS and CCD imagers: Part II
Author(s): James Janesick; James Andrews; John Tower; Mark Grygon; Tom Elliott; John Cheng; Michael Lesser; Jeff Pinter
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Paper Abstract

A new class of CMOS imagers that compete with scientific CCDs is presented. The sensors are based on deep depletion backside illuminated technology to achieve high near infrared quantum efficiency and low pixel cross-talk. The imagers deliver very low read noise suitable for single photon counting - Fano-noise limited soft x-ray applications. Digital correlated double sampling signal processing necessary to achieve low read noise performance is analyzed and demonstrated for CMOS use. Detailed experimental data products generated by different pixel architectures (notably 3TPPD, 5TPPD and 6TPG designs) are presented including read noise, charge capacity, dynamic range, quantum efficiency, charge collection and transfer efficiency and dark current generation. Radiation damage data taken for the imagers is also reported.

Paper Details

Date Published: 14 September 2007
PDF: 23 pages
Proc. SPIE 6690, Focal Plane Arrays for Space Telescopes III, 669003 (14 September 2007); doi: 10.1117/12.740218
Show Author Affiliations
James Janesick, Sarnoff Corp. (United States)
James Andrews, Sarnoff Corp. (United States)
John Tower, Sarnoff Corp. (United States)
Mark Grygon, Sarnoff Corp. (United States)
Tom Elliott, Jet Propulsion Lab. (United States)
John Cheng, Chronicle Technology (United States)
Michael Lesser, Steward Observatory, Univ. of Arizona (United States)
Jeff Pinter, Sarnoff Corp. (United States)

Published in SPIE Proceedings Vol. 6690:
Focal Plane Arrays for Space Telescopes III
Thomas J. Grycewicz; Cheryl J. Marshall; Penny G. Warren, Editor(s)

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