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Proceedings Paper

Spectrometer concept and design for X-ray astronomy using a blazed transmission grating
Author(s): Kathryn Flanagan; Minseung Ahn; John Davis; Ralf Heilmann; David Huenemoerder; Alan Levine; Herman Marshall; Gregory Prigozhin; Andrew Rasmussen; George Ricker; Mark Schattenburg; Norbert Schulz; Yong Zhao
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Paper Abstract

We present a spectrometer design based on a novel nanofabricated blazed X-ray transmission grating which is modeled to have superior efficiency. Here we outline a full instrument design proposed for Constellation-X which is expected to give resolving powers ~2000 (HEW). The spectrometer advantages include lower mass budget and smaller diffractor area, as well as order-of-magnitude more relaxed alignment tolerances for crucial degrees of freedom than reflection grating schemes considered in the past1,2,3. The spectrometer readout is based on conventional CCD technology adapted to operate with very high speed and low power. This instrument will enable high resolution absorption and emission line spectroscopy in the critical band between 0.2 and 1.5 keV.

Paper Details

Date Published: 20 September 2007
PDF: 12 pages
Proc. SPIE 6688, Optics for EUV, X-Ray, and Gamma-Ray Astronomy III, 66880Y (20 September 2007); doi: 10.1117/12.739941
Show Author Affiliations
Kathryn Flanagan, Massachusetts Institute of Technology (United States)
Minseung Ahn, Massachusetts Institute of Technology (United States)
John Davis, Massachusetts Institute of Technology (United States)
Ralf Heilmann, Massachusetts Institute of Technology (United States)
David Huenemoerder, Massachusetts Institute of Technology (United States)
Alan Levine, Massachusetts Institute of Technology (United States)
Herman Marshall, Massachusetts Institute of Technology (United States)
Gregory Prigozhin, Massachusetts Institute of Technology (United States)
Andrew Rasmussen, Stanford Univ. (United States)
George Ricker, Massachusetts Institute of Technology (United States)
Mark Schattenburg, Massachusetts Institute of Technology (United States)
Norbert Schulz, Massachusetts Institute of Technology (United States)
Yong Zhao, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 6688:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy III
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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