Share Email Print
cover

Proceedings Paper

Spatial coherence profilometry
Author(s): Pavel Pavlíček; Zhihui Duan; Mitsuo Takeda
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Spatial coherence profilometry is a method for measurement of the geometrical form of objects. In addition to the two lateral coordinates x and y, it measures the longitudinal coordinate z. In this way the complete 3D description of the object's surface is acquired. The main piece of the presented method is a Michelson interferometer illuminated by a monochromatic spatially extended light source. The surface of the object whose geometrical form should be measured is used as one mirror of the Michelson interferometer. By moving of the measured object along the optical axis, the intereference is observable only if the object's surface occurs in the vicinity of the so-called reference plane. The reference plane is given by the position of the object mirror when the Michelson interferometer is balanced. The described effect follows from the form of the spatial coherence function originated by the spatially extended light source. If the intensity at the output of the interferometer is recorded as a function of the position of the measured object, a typical correlogram arises. This correlogram is similar to that known with white-light interferometry. From the maximum of the correlogram, the z coordinate of the object's surface can be determined. Usually a CCD camera is used as the detector at the output of the Michelson interferometer. Then z coordinates of many surface points are parallel measured in the course of one measurement procedure and the 3D description of the object's surface is acquired. The scanning in the lateral direction is not necessary. Thus the described method provides a spatial coherence analogy to white-light interferometry which is based on temporal coherence. Unlike white-light interferometry, the described method does not require a broadband light source, the interferometer is illuminated by a monochromatic light source, usually a laser.

Paper Details

Date Published: 12 April 2007
PDF: 7 pages
Proc. SPIE 6609, 15th Czech-Polish-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics, 660916 (12 April 2007); doi: 10.1117/12.739667
Show Author Affiliations
Pavel Pavlíček, Joint Lab. of Optics of Palacky Univ. and Institute of Physics (Czech Republic)
Zhihui Duan, The Univ. of Electro-Communications (Japan)
Mitsuo Takeda, The Univ. of Electro-Communications (Japan)


Published in SPIE Proceedings Vol. 6609:
15th Czech-Polish-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics

© SPIE. Terms of Use
Back to Top