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Proceedings Paper

Application of Shack-Hartmann wavefront sensor for testing optical systems
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Paper Abstract

Our work deals with a method of measurement of the wavefront shape using the lenslet array objective based on the Shack-Hartmann method. An analysis and computer simulation was carried out for the designed wavefront sensor, devoted to optical testing applications. The obtained accuracy is comparable to common interferometric techniques in optical industry, and it is sufficient for testing of optical elements and systems. Our work focuses on an application of the sensor for image quality testing of optical systems and measurement of centricity of optical systems. Several experiments were made for testing optical systems in UV and visible spectrum using the wavefront sensor, which verified the reliability and accuracy of the sensor for the case of optical system testing in optical industry.

Paper Details

Date Published: 12 April 2007
PDF: 11 pages
Proc. SPIE 6609, 15th Czech-Polish-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics, 660915 (12 April 2007); doi: 10.1117/12.739665
Show Author Affiliations
Jiri Novak, Czech Technical Univ. in Prague (Czech Republic)
Pavel Novak, Czech Technical Univ. in Prague (Czech Republic)
Antonin Miks, Czech Technical Univ. in Prague (Czech Republic)


Published in SPIE Proceedings Vol. 6609:
15th Czech-Polish-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics

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