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Proceedings Paper

Characterizations and measurements of CZT material: novel techniques and results
Author(s): G. S. Camarda; N. M. Abdul-Jabbar; S. Babalola; A. E. Bolotnikov; Y. Cui; A. Hossain; E. Jackson; H. Jackson; J. R. James; A. L. Luryi; M. Groza; A. Burger; R. B. James
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Paper Abstract

The performance of current long-drift-length Cadmium Zinc Telluride (CZT) detectors principally is determined by the material's quality. Hence, the material's limitations must be better understood and potential solutions identified to grow CZT crystals with the required qualities. Our efforts have focused on developing novel techniques and testing methods that will allow us to explore the correlations between the crystal's defects and the detector's properties. Local stoichiometric variations and other local disordering make it very hard to systematically correlate performance and material defects on a macroscopic scale. Therefore, to delineate the factors limiting the energy resolution of CZT detectors, we directed our efforts towards micron-scale material characterization and assessments of the detectors using the National Synchrotron Light Source (NSLS). The NSLS offers us a highly collimated high-intensity X-ray beam that we employed to undertake detector-performance mapping, and to investigate the association between microscopic defects and fluctuations in collected charge. In this paper, we illustrate our techniques and results.

Paper Details

Date Published: 21 September 2007
PDF: 8 pages
Proc. SPIE 6706, Hard X-Ray and Gamma-Ray Detector Physics IX, 670605 (21 September 2007); doi: 10.1117/12.739604
Show Author Affiliations
G. S. Camarda, Brookhaven National Lab. (United States)
N. M. Abdul-Jabbar, Univ. of Michigan (United States)
S. Babalola, Vanderbilt Univ. (United States)
A. E. Bolotnikov, Brookhaven National Lab. (United States)
Y. Cui, Brookhaven National Lab. (United States)
A. Hossain, Brookhaven National Lab. (United States)
E. Jackson, Vanderbilt Univ. (United States)
H. Jackson, Vanderbilt Univ. (United States)
J. R. James, Tennessee Technological Univ. (United States)
A. L. Luryi, Cornell Univ. (United States)
M. Groza, Fisk Univ. (United States)
A. Burger, Fisk Univ. (United States)
R. B. James, Brookhaven National Lab. (United States)

Published in SPIE Proceedings Vol. 6706:
Hard X-Ray and Gamma-Ray Detector Physics IX
Ralph B. James; Arnold Burger; Larry A. Franks, Editor(s)

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