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Proceedings Paper

New method for measurement of far IR beam intensity profile
Author(s): Alexander A. Soloviev; Efim A. Khazanov; Ilya E. Kozhevatov; Oleg V. Palashov
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Paper Abstract

A novel method for measuring the intensity profile of far-infrared radiation is presented. The idea is to measure nonstationary thermally induced variations in optical thickness of a target heated by the studied radiation. The optical thickness variations are observed by an interferometer. Beams with an aperture up to 60 mm may be measured with a spatial resolution of I mm.

Paper Details

Date Published: 10 April 2007
PDF: 10 pages
Proc. SPIE 6613, Laser Optics 2006: Wavefront Transformation and Laser Beam Control, 661308 (10 April 2007); doi: 10.1117/12.739349
Show Author Affiliations
Alexander A. Soloviev, The Institute of Applied Physics (Russia)
Efim A. Khazanov, The Institute of Applied Physics (Russia)
Ilya E. Kozhevatov, The Institute of Applied Physics (Russia)
Oleg V. Palashov, The Institute of Applied Physics (Russia)


Published in SPIE Proceedings Vol. 6613:
Laser Optics 2006: Wavefront Transformation and Laser Beam Control

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