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Proceedings Paper

Differential aperture x-ray microscopy near Te precipitates in CdZnTe
Author(s): E. A. Miller; M. Toloczko; C. E. Seifert; A. Seifert; W. Liu; M. Bliss
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Paper Abstract

We report the results of Differential Aperture X-ray Microscopy (DAXM) measurements near Te precipitates in CdZnTe grown via low-pressure Bridgman. White-beam Laue patterns were acquired with 3-D spatial resolution (with 0.25 μm resolution in the scanning directions and 1 μm resolution in depth) at depths of up to 35 μm deep normal to the surface. We find very little crystal strain (< 10-3) or rotation (<0.05 degrees) near Te precipitates. We also examine local deformations in the vicinity of a microhardness indent, and find that although significant rotations exist, the spatial extent is limited to a few tens of microns. Furthermore, observed crystal strains are limited to 5 x 10-3 or less in regions near the microhardness indent.

Paper Details

Date Published: 21 September 2007
PDF: 7 pages
Proc. SPIE 6706, Hard X-Ray and Gamma-Ray Detector Physics IX, 670609 (21 September 2007); doi: 10.1117/12.738959
Show Author Affiliations
E. A. Miller, Pacific Northwest National Lab. (United States)
M. Toloczko, Pacific Northwest National Lab. (United States)
C. E. Seifert, Pacific Northwest National Lab. (United States)
A. Seifert, Pacific Northwest National Lab. (United States)
W. Liu, Argonne National Lab. (United States)
M. Bliss, Pacific Northwest National Lab. (United States)


Published in SPIE Proceedings Vol. 6706:
Hard X-Ray and Gamma-Ray Detector Physics IX
Ralph B. James; Arnold Burger; Larry A. Franks, Editor(s)

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