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Proceedings Paper

Readout durability improvement of super-resolution near-field structure disc using germanium nitride interface layers
Author(s): Takayuki Shima; Yuzo Yamakawa; Junji Tominaga; Jooho Kim
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Paper Abstract

Inserting germanium nitride thin films between Sb-Te (for super-resolution readout) and ZnS-SiO2 layers was effective to improve super-resolution readout durability of a super-RENS disc using a PtOx-SiO2 write-once recording layer. Waveform of 97-nm (that is below the resolution limit of the optics used) and 340-nm combined marks scarcely changed even after 50,000 times readout. CNR of 100 nm marks was stable (within 3 dB decrease) after 268,000 times readout.

Paper Details

Date Published: 11 July 2007
PDF: 6 pages
Proc. SPIE 6620, Optical Data Storage 2007, 662011 (11 July 2007); doi: 10.1117/12.738929
Show Author Affiliations
Takayuki Shima, National Institute of Advanced Industrial Science and Technology (Japan)
Yuzo Yamakawa, National Institute of Advanced Industrial Science and Technology (Japan)
Junji Tominaga, National Institute of Advanced Industrial Science and Technology (Japan)
Jooho Kim, Samsung Electronics Co., Ltd. (South Korea)


Published in SPIE Proceedings Vol. 6620:
Optical Data Storage 2007

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