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Proceedings Paper

Localized recording approaches and phase metrology for holographic storage
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Paper Abstract

The number of layers of a micro-holographic disk is limited by wavefront aberration which is strongly dependent on the photopolymer initiation, termination and inhibition kinetics. 3D metrology is used to validate predicted index profiles.

Paper Details

Date Published: 11 July 2007
PDF: 7 pages
Proc. SPIE 6620, Optical Data Storage 2007, 66200C (11 July 2007); doi: 10.1117/12.738585
Show Author Affiliations
Robert R. McLeod, Univ. of Colorado, Boulder (United States)
Matthew W. Grabowski, Univ. of Colorado, Boulder (United States)
Mark R. Ayres, Univ. of Colorado, Boulder (United States)
InPhase Technologies, Inc. (United States)
Amy C. Sullivan, Univ. of Colorado, Boulder (United States)

Published in SPIE Proceedings Vol. 6620:
Optical Data Storage 2007

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