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Proceedings Paper

Measurements of adsorption strain in porous silicon by Raman scattering
Author(s): M. A. Ferrara; L. Sirleto; G. Messina; M. G. Donato; S. Santangelo; I. Rendina
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Paper Abstract

The stress in porous silicon during exposition to a liquid is investigated by an approach based on Raman scattering. When the porous silicon structure is exposed to isopropanol or ethanol, a reversible blue shift of the Raman spectra is observed. The blue shift of Raman scattering is ascribed to the contraction induced by the liquids that fill the pores.

Paper Details

Date Published: 2 July 2007
PDF: 4 pages
Proc. SPIE 6619, Third European Workshop on Optical Fibre Sensors, 661913 (2 July 2007); doi: 10.1117/12.738402
Show Author Affiliations
M. A. Ferrara, IMM-CNR (Italy)
Univ. Mediterranea di Reggio Calabria (Italy)
L. Sirleto, IMM-CNR (Italy)
G. Messina, Univ. Mediterranea di Reggio Calabria (Italy)
M. G. Donato, Univ. Mediterranea di Reggio Calabria (Italy)
S. Santangelo, Univ. Mediterranea di Reggio Calabria (Italy)
I. Rendina, IMM-CNR (Italy)


Published in SPIE Proceedings Vol. 6619:
Third European Workshop on Optical Fibre Sensors

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