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Proceedings Paper

A study of aerosol particle sorting to provide enriched samples for improved bio-threat analysis
Author(s): Joseph T. McGinn; Timothy Pletcher; David Keller
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Paper Abstract

Detection of biological threats in room air is a challenging problem due to their low concentration and the relatively high concentration of background. Dynamic sorting of threat particles from background clutter and dust prior to collection for analysis can provide substantially enriched samples with the advantages of greater analytical accuracy in shorter periods of time. The conceptually simple process of capturing threat particles and rejecting background in fact requires sophisticated particle detection and classification, timing, capture and final threat identification subsystems operating in concert. The effectiveness of the process is also strongly influenced by the operational conditions including threat and background loads as well as the time allotted for sample collection. The requirements of the final threat identification system will dictate the form factor for the collected sample and if collection is to be done dry or into a liquid. A number of sorting systems are currently under development to achieve enrichment for subsequent analysis. Enrichment factors, a common figure of merit for these systems, will be shown to be an inadequate indicator for comparing these systems unless standard operating conditions are used and other parameters are well defined. A set of parameters will be suggested that better allows characterization of the collection component of the sorting system.

Paper Details

Date Published: 7 November 2007
PDF: 9 pages
Proc. SPIE 6739, Electro-Optical Remote Sensing, Detection, and Photonic Technologies and Their Applications, 673911 (7 November 2007); doi: 10.1117/12.737904
Show Author Affiliations
Joseph T. McGinn, Sarnoff Corp. (United States)
Timothy Pletcher, Sarnoff Corp. (United States)
David Keller, Sarnoff Corp. (United States)

Published in SPIE Proceedings Vol. 6739:
Electro-Optical Remote Sensing, Detection, and Photonic Technologies and Their Applications
Gary W. Kamerman; Keith A. Krapels; John C. Carrano; Arturas Zukauskas; Ove K. Steinvall; Keith L. Lewis; Keith A. Krapels, Editor(s)

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