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Characterization and correction of stray light in optical instruments
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Paper Abstract

Improperly imaged, or scattered, optical radiation within an instrument is difficult to properly characterize and is often the dominant residual source of measurement error. Scattered light can originate from the spectral components of a "point" source and from spatial elements of an extended source. The spectral and spatial scattered light components are commonly referred to as stray light and can be described by an instrument's spectral line spread function (SLSF) and point spread function (PSF), respectively. In this paper, we present approaches that characterize an instrument's response to scattered light and describe matrices that have been developed to correct an instrument's response for this scattered light. Examples are given to demonstrate the efficacy of the approach and implications for remote sensing instruments are discussed.

Paper Details

Date Published: 26 October 2007
PDF: 11 pages
Proc. SPIE 6744, Sensors, Systems, and Next-Generation Satellites XI, 67441L (26 October 2007); doi: 10.1117/12.737315
Show Author Affiliations
Yuqin Zong, National Institute of Standards and Technology (United States)
Steven W. Brown, National Institute of Standards and Technology (United States)
Gerhard Meister, Futuretech Corp. (United States)
Robert A. Barnes, NASA Goddard Space Flight Ctr. (United States)
Keith R. Lykke, National Institute of Standards and Technology (United States)

Published in SPIE Proceedings Vol. 6744:
Sensors, Systems, and Next-Generation Satellites XI
Shahid Habib; Roland Meynart; Steven P. Neeck; Haruhisa Shimoda, Editor(s)

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