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Proceedings Paper

Characterization of thin plastic foils for applications in x-ray optics technology
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Paper Abstract

Thin plastic foils are being investigated to build shell optics for X-ray telescopes. Compared to polished glass optics, the advantage is in terms of increased collecting area, light weight and lower cost. Plastic material is also desirable to allow deformation into a complete surface of revolution. We collected plastic materials of common use for industrial applications and also specialty materials developed for the electronic industry. A comparative study was then performed to evaluate the optical quality of the selected plastic films. Surface analysis was carried out with topographic instruments to investigate the microroughness of our samples at different scan lengths. Preliminary results suggest that a facility for the production of high-performance films with adequate microroughness is needed.

Paper Details

Date Published: 20 September 2007
PDF: 8 pages
Proc. SPIE 6688, Optics for EUV, X-Ray, and Gamma-Ray Astronomy III, 66881B (20 September 2007); doi: 10.1117/12.737115
Show Author Affiliations
Angelo Taibi, Univ. di Ferrara (Italy)
INAF-Osservatorio Astronomico di Palermo G.S. Vaiana (Italy)
Marco Barbera, INAF-Osservatorio Astronomico di Palermo G.S. Vaiana (Italy)
Univ. di Palermo (Italy)
Giovanni Pareschi, INAF-Osservatorio Astronomico di Brera (Italy)
Herbert W. Schnopper, Smithsonian Astrophysical Observatory (United States)
Giorgia Sironi, INAF-Osservatorio Astronomico di Brera (Italy)
Renzo Valtolina, INAF-Osservatorio Astronomico di Brera (Italy)


Published in SPIE Proceedings Vol. 6688:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy III
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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