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Proceedings Paper

Ultrasonic NDE of silicon carbide lightweight systems
Author(s): Andrew R Portune; Richard A. Haber; Raymond E. Brennan
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Paper Abstract

Silicon carbide (SiC) high energy mirrors from M-Cubed, Schafer Corp, Poco and Trex Inc. were investigated using nondestructive ultrasound C-scan imaging. Reflected signal amplitude variations from the top surface of the SiC mirrors were imaged to locate surface and subsurface inhomogeneities. Where possible, the bottom surface reflected signal amplitude and material velocity were mapped to evaluate bulk properties. Elastic property mapping was also performed on a dense SiC mirror sample to look for regional variations in Poisson's ratio, Young's modulus, shear modulus, and bulk modulus. These ultrasound techniques were successfully utilized for detection of subsurface inhomogeneities in the SiC mirror samples.

Paper Details

Date Published: 17 September 2007
PDF: 12 pages
Proc. SPIE 6666, Optical Materials and Structures Technologies III, 66660C (17 September 2007); doi: 10.1117/12.736934
Show Author Affiliations
Andrew R Portune, Rutgers Univ. (United States)
Richard A. Haber, Rutgers Univ. (United States)
Raymond E. Brennan, Rutgers Univ. (United States)

Published in SPIE Proceedings Vol. 6666:
Optical Materials and Structures Technologies III
William A. Goodman; Joseph L. Robichaud, Editor(s)

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