Share Email Print

Proceedings Paper

Illumination system tolerancing
Author(s): R. John Koshel
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Tolerancing of illumination systems is currently a difficult task, especially for components that are injection molded. The ISO standards are not applicable to such systems due to their innate requirements of image formation. Methods to parameterize the shape of injection-molded optical components are presented. First, a method based on experimental measurement of actual components is presented. Next, this method is extended to the Monte Carlo formation of perturbed parts based upon these measurements. Finally, a method based on the application of a bi-directional surface distribution function (BSDF), i.e., scatter profile, is based upon ray-trace results from the application of the experimental measurements. The BSDF method is fit with the ABg scatter function, applied to witness sample surfaces, and compared to the perturbation method. The utility of these two methods is presented, whereby the BSDF method is appropriate for systems with many ray-surface interactions, while the perturbation method is best suited for systems with limited ray-surface interactions.

Paper Details

Date Published: 21 September 2007
PDF: 12 pages
Proc. SPIE 6676, Optical System Alignment and Tolerancing, 667604 (21 September 2007); doi: 10.1117/12.736540
Show Author Affiliations
R. John Koshel, Lambda Research Corp. (United States)
College of Optical Sciences, The Univ. of Arizona (United States)

Published in SPIE Proceedings Vol. 6676:
Optical System Alignment and Tolerancing
José M. Sasian; Mitchell C. Ruda, Editor(s)

© SPIE. Terms of Use
Back to Top