Share Email Print
cover

Proceedings Paper

Characterization of very large format 1Kx1K LWIR QWIP focal plane array
Author(s): Don Rafol; Eric Cho; Wah Lim
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Focal plane arrays (FPAs), which are two-dimensional array of detectors hybridized to Read Out Integrated Circuits (ROIC), present unique challenges in characterization and functionality tests. Parameters such as temporal and spatial NEΔT, detectivity (D*), quantum efficiency (η), spectral response (R(λ)), etc., are generally the typical figures of merits. However, detailed operational information extractable from the electro-optical properties of the FPAs normally requires very time-consuming data analyses. One major difficulty in analyzing large format FPAs is the volume of data that are present in dealing with individual or group of pixels. Additional complications arise from circuit and subsystems that are an integral part of the FPA operations, and analyzing their effect individually requires detailed knowledge of the ROIC properties and the driving electronics. The noise analyses add another complexity in understanding the characteristics since noises can be generated externally as well as internally. The characterization techniques presented in this paper are performed specifically for very large format 1Kx1K LWIR QWIP FPA but will also be applicable to other types of FPAs.

Paper Details

Date Published: 26 September 2007
PDF: 13 pages
Proc. SPIE 6678, Infrared Spaceborne Remote Sensing and Instrumentation XV, 66780X (26 September 2007); doi: 10.1117/12.736137
Show Author Affiliations
Don Rafol, Diversified Electronics Corp./Infravision (United States)
Eric Cho, QWIP Technology (United States)
Wah Lim, Wah Lim and Associates (United States)


Published in SPIE Proceedings Vol. 6678:
Infrared Spaceborne Remote Sensing and Instrumentation XV
Marija Strojnik-Scholl, Editor(s)

© SPIE. Terms of Use
Back to Top