Share Email Print

Proceedings Paper

High-resolution soft x-ray spectroscopy for constellation X
Author(s): Charles Lillie; Webster Cash; Nahum Arav; J. Michael Shull; Jeffrey Linsky
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The Constellation-X mission, with 5 to 10 times the collecting area of any previous x-ray observatory, will obtain high-throughput, high resolution spectroscopic observations of x-ray sources ranging from super-massive black holes to the disks around young stars in the 0.25-4.0 keV region of the spectrum. We describe the need for high resolution X-ray spectroscopy on the Constellation-X mission, the various options for obtaining it, and the implementation that we recommend;, e.g. an off-plane grating system that can simultaneously provide spectral resolutions (λ/δλ) as high as 3000 and substantially increased throughput in the 0.2 to 2.0 keV region. As a flagship mission, Constellation-X will be a general purpose facility for the astronomy community. The reflection grating system we describe will enable Constellation-X to address the important questions of the next generation within NASA's current cost target.

Paper Details

Date Published: 13 September 2007
PDF: 12 pages
Proc. SPIE 6686, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XV, 668612 (13 September 2007); doi: 10.1117/12.735473
Show Author Affiliations
Charles Lillie, Northrop Grumman Space Technology (United States)
Webster Cash, University of Colorado, Boulder (United States)
Nahum Arav, University of Colorado, Boulder (United States)
J. Michael Shull, University of Colorado, Boulder (United States)
Jeffrey Linsky, University of Colorado, Boulder (United States)

Published in SPIE Proceedings Vol. 6686:
UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XV
Oswald H.W. Siegmund, Editor(s)

© SPIE. Terms of Use
Back to Top