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Proceedings Paper

The generation of random non-overlapping dot patterns for light guides using molecular dynamics simulations with variable r-cut and reflective boundary techniques
Author(s): Jee-Gong Chang; Chuan Chen; Shin-Pon Ju; Yu-Bin Fang
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Paper Abstract

This paper presents a molecular dynamics (MD) scheme for the automatic generation of dot patterns for the light guides used in LCD backlight modules. Several MD computational techniques are integrated with the conventional MD scheme to enable the adjustment of the dot density in specific regions of the light guide in order to create a dot distribution with a high dot density variation and a high spatial uniformity. These techniques include the cell division technique, the variable r-cut technique, the boundary smoothing technique and the reflective boundary condition. The reflective boundary condition enables a precise control of the dot density within each cell, and is instrumental in achieving a dot distribution with both a high dot density variation and a high spatial uniformity. The performance of the proposed dot generation scheme is verified by considering the practical example of the dot pattern design of a light guide with a single LED light source located in the lower-right corner. The numerical results confirm the ability of the proposed method to achieve an even luminance condition by establishing a dot pattern whose density increases concentrically with an increasing distance from the light source.

Paper Details

Date Published: 18 September 2007
PDF: 11 pages
Proc. SPIE 6670, Nonimaging Optics and Efficient Illumination Systems IV, 66700R (18 September 2007); doi: 10.1117/12.735410
Show Author Affiliations
Jee-Gong Chang, National Ctr. for High-Performance Computing (Taiwan)
Chuan Chen, Meiho Institute of Technology (Taiwan)
Shin-Pon Ju, Nat'l Sun-Yat-Sun Univ. (Taiwan)
Yu-Bin Fang, National Ctr. for High-Performance Computing (Taiwan)

Published in SPIE Proceedings Vol. 6670:
Nonimaging Optics and Efficient Illumination Systems IV
Roland Winston; R. John Koshel, Editor(s)

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