Share Email Print

Proceedings Paper

Characterization of beryllium and CVD diamond for synchrotron radiation beamline windows and x-ray beam monitor
Author(s): S. Goto; S. Takahashi; T. Kudo; M. Yabashi; K. Tamasaku; Y. Nishino; T. Ishikawa
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We characterized beryllium foils and CVD diamond films/plates for synchrotron radiation beamline windows and x-ray beam monitor especially in coherent x-ray applications. Sub-micron-resolution imaging with a zooming tube was performed using spatially coherent x-rays at 1-km beamline 29XU of SPring-8. We found that the speckles observed in the conventional powder and ingot beryllium foils were due to voids with diameter of several to ten-several microns. The physical vapor deposition (PVD) eliminated the voids and the PVD beryllium showed the best performance with no speckles. We characterized a commercially available polycrystalline CVD diamond window and CVD films as well as beryllium foils. Polished thin diamond film showed rather uniform transmission image. We found dark spots at in-line image due to Bragg diffraction from grains for thicker CVD diamond window.

Paper Details

Date Published: 20 September 2007
PDF: 8 pages
Proc. SPIE 6705, Advances in X-Ray/EUV Optics and Components II, 67050H (20 September 2007); doi: 10.1117/12.735356
Show Author Affiliations
S. Goto, SPring-8, JASRI (Japan)
S. Takahashi, SPring-8, JASRI (Japan)
T. Kudo, SPring-8, JASRI (Japan)
M. Yabashi, SPring-8, RIKEN (Japan)
K. Tamasaku, SPring-8, RIKEN (Japan)
Y. Nishino, SPring-8, RIKEN (Japan)
T. Ishikawa, SPring-8, RIKEN (Japan)

Published in SPIE Proceedings Vol. 6705:
Advances in X-Ray/EUV Optics and Components II
Ali M. Khounsary; Christian Morawe; Shunji Goto, Editor(s)

© SPIE. Terms of Use
Back to Top