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Proceedings Paper

Characterization of beryllium and CVD diamond for synchrotron radiation beamline windows and x-ray beam monitor
Author(s): S. Goto; S. Takahashi; T. Kudo; M. Yabashi; K. Tamasaku; Y. Nishino; T. Ishikawa
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Paper Abstract

We characterized beryllium foils and CVD diamond films/plates for synchrotron radiation beamline windows and x-ray beam monitor especially in coherent x-ray applications. Sub-micron-resolution imaging with a zooming tube was performed using spatially coherent x-rays at 1-km beamline 29XU of SPring-8. We found that the speckles observed in the conventional powder and ingot beryllium foils were due to voids with diameter of several to ten-several microns. The physical vapor deposition (PVD) eliminated the voids and the PVD beryllium showed the best performance with no speckles. We characterized a commercially available polycrystalline CVD diamond window and CVD films as well as beryllium foils. Polished thin diamond film showed rather uniform transmission image. We found dark spots at in-line image due to Bragg diffraction from grains for thicker CVD diamond window.

Paper Details

Date Published: 20 September 2007
PDF: 8 pages
Proc. SPIE 6705, Advances in X-Ray/EUV Optics and Components II, 67050H (20 September 2007); doi: 10.1117/12.735356
Show Author Affiliations
S. Goto, SPring-8, JASRI (Japan)
S. Takahashi, SPring-8, JASRI (Japan)
T. Kudo, SPring-8, JASRI (Japan)
M. Yabashi, SPring-8, RIKEN (Japan)
K. Tamasaku, SPring-8, RIKEN (Japan)
Y. Nishino, SPring-8, RIKEN (Japan)
T. Ishikawa, SPring-8, RIKEN (Japan)


Published in SPIE Proceedings Vol. 6705:
Advances in X-Ray/EUV Optics and Components II
Ali M. Khounsary; Christian Morawe; Shunji Goto, Editor(s)

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