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Proceedings Paper

Performance measurements of Al/CdTe/Pt pixel diode detectors
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Paper Abstract

We developed Schottky CdTe detectors using Al as an anode electrode and measured their performances. We first fabricated monolithic detectors with four different thicknesses of 0.5, 0.75, 1.0, and 2.0 mm. An Al anode electrode was implemented with a guard-ring structure. For the 0.5 mm thick CdTe detector, an energy resolution of 1.2 keV (FWHM) at 122 keV was achieved at a temperature of −20 °C and a bias voltage of 400 V. Using the same technology, we next developed 8 × 8 pixel CdTe detectors, again with the four different thicknesses. The Al anode electrode was pixelated and the Pt cathode was made as a single plate. Signals from all pixels were successfully obtained and an energy resolution of 1.3 keV and 1.9 keV (FWHM) for 59.5 keV and 122 keV gamma-rays, was achieved at a temperature of −20 °C and a bias voltage of 400 V using the 0.5 mm thick CdTe detector. The energy resolution was nearly the same in each pixel.

Paper Details

Date Published: 21 September 2007
PDF: 10 pages
Proc. SPIE 6706, Hard X-Ray and Gamma-Ray Detector Physics IX, 67060M (21 September 2007); doi: 10.1117/12.735188
Show Author Affiliations
Shin-nosuke Ishikawa, Institute of Space and Astronautical Science (Japan)
Univ. of Tokyo (Japan)
Hiroyuki Aono, Institute of Space and Astronautical Science (Japan)
Univ. of Tokyo (Japan)
Shin Watanabe, Institute of Space and Astronautical Science (Japan)
Shin'ichiro Takeda, Institute of Space and Astronautical Science (Japan)
Univ. of Tokyo (Japan)
Kazuhiro Nakazawa, Univ. of Tokyo (Japan)
Tadayuki Takahashi, Institute of Space and Astronautical Science (Japan)
Univ. of Tokyo (Japan)


Published in SPIE Proceedings Vol. 6706:
Hard X-Ray and Gamma-Ray Detector Physics IX
Ralph B. James; Arnold Burger; Larry A. Franks, Editor(s)

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