Share Email Print
cover

Proceedings Paper

The Instrument Model: performance prediction simulator for SIM PlanetQuest
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The SIM Instrument Model performs single tile simulations for the SIM Instrument. It provides a tool to combine the effects of errors in the different subsystems such as the science interferometer, guide interferometer, external metrology sensor, and roll sensor. The inputs to the Instrument Model are the sensor errors for the internal instrument measurements. These errors can be derived from testbeds or other physical models. The Instrument Model perturbs ideal sensors and replicates the fundamental SIM processing called delay regularization. This process reconstructs the science interferometer measurements by using additional sensor measurements. The output of the Instrument Model is the regularized delay, which is the principal science measurement for various observing scenarios such as Wide Angle Grid, and Narrow Angle observations. The primary role of the Instrument Model has been single tile performance prediction but it also serves as variety of different system engineering activities such as validation of the SIM Astrometric Error Budget, demonstration of SIM's capability for picometer sensing for the SIM Technology Milestone 8, development of instrument calibrations, analysis of system level errors, and validation of the averaging approach for the science data processing. The Instrument Model will continue to be an integral part of the SIM modeling plan to predict single tile performance for the SIM mission.

Paper Details

Date Published: 14 September 2007
PDF: 12 pages
Proc. SPIE 6675, Optical Modeling and Performance Predictions III, 667509 (14 September 2007); doi: 10.1117/12.734994
Show Author Affiliations
Mauricio J. Morales, Jet Propulsion Lab. (United States)
Nanaz Fathpour, Jet Propulsion Lab. (United States)


Published in SPIE Proceedings Vol. 6675:
Optical Modeling and Performance Predictions III
Mark A. Kahan, Editor(s)

© SPIE. Terms of Use
Back to Top