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Proceedings Paper

Plasma interactions in laser irradiated semi-cylindrical cavities studied with soft x-ray interferometry using a capillary discharge laser
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Paper Abstract

Soft x-ray interferometry was used to measure the evolution of dense converging plasmas created by laser irradiation of 500 μm diameter semi-cylindrical carbon targets. Optical laser pulses with an intensity of ~1×1012W cm-2 and 120 ps duration were used to heat the surface of the cavities. The dense plasma formed expands from the walls converging slightly off the semi-cylinder's axis, giving rise to a bright localized high density plasma region. A sequence of electron density maps were measure using a 46.9 nm wavelength tabletop capillary discharge soft x-ray laser probe and an amplitude division interferometer based on diffraction gratings. The measured density profiles are compared with simulations conducted using the multi-diminensional hydrodynamic code HYDRA. The benchmarked model was then used to simulate particle trajectories which reveal that the increase in electron density near the axis is mainly the result of the convergence of plasma that originated at the bottom of the groove during laser irradiation.

Paper Details

Date Published: 15 October 2007
PDF: 11 pages
Proc. SPIE 6702, Soft X-Ray Lasers and Applications VII, 670204 (15 October 2007); doi: 10.1117/12.734876
Show Author Affiliations
M. Purvis, Colorado State Univ. (United States)
J. Grava, Colorado State Univ. (United States)
J. Filevich, Colorado State Univ. (United States)
M. C. Marconi, Colorado State Univ. (United States)
J. J. Rocca, Colorado State Univ. (United States)
James Dunn, Lawrence Livermore National Lab. (United States)
Stephen J. Moon, Lawrence Livermore National Lab. (United States)
Joseph Nilsen, Lawrence Livermore National Lab. (United States)
Vyacheslav N. Shlyaptsev, Univ. of California, Davis (United States)
Elizabeth Jankowska, Wroclaw Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 6702:
Soft X-Ray Lasers and Applications VII
Gregory J. Tallents; James Dunn, Editor(s)

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