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Proceedings Paper

Comparison of slope and height profiles for flat synchrotron x-ray mirrors measured with a long trace profiler and a PMI Fizeau interferometer
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Paper Abstract

Long trace profilers (LTPs)(1) have been used at many synchrotron radiation laboratories worldwide for over a decade to measure surface slope profiles of long grazing incidence x-ray mirrors. Phase measuring interferometers (PMIs) of the Fizeau type, on the other hand, are being used by most mirror manufacturers to accomplish the same task. However, large mirrors whose dimensions exceed the aperture of the Fizeau interferometer require measurements to be carried out at grazing incidence, and aspheric optics require the use of a null lens. While an LTP provides a direct measurement of 1D slope profiles, PMIs measure area height profiles from which the slope can be obtained by a differentiation algorithm. Measurements of the two types of instruments have been found by us to be in good agreement, but to our knowledge there is no published work directly comparing the two instruments. This paper documents that comparison. We measured two different nominally flat mirrors with both the LTP in operation at the Advanced Photon Source (a type-II LTP) and a Fizeau-type PMI interferometer (Wyko model 6000). One mirror was 500 mm long and made of Zerodur, and the other mirror was 350 mm long and made of silicon. Slope error results with these instruments agree within nearly 100% (3.11±0.15 μrad for the LTP, and 3.11±0.02μrad for the Fizeau PMI interferometer) for the medium quality Zerodur mirror with 3 μrad rms nominal slope error. A significant difference was observed with the much higher quality silicon mirror. For the Si mirror, slope error data is 0.39±0.08Χrad from LTP measurements but it is 0.35 ± 0.01 μrad from PMI interferometer measurements. The standard deviations show that the Fizeau PMI interferometer has much better measurement repeatability.

Paper Details

Date Published: 20 September 2007
PDF: 7 pages
Proc. SPIE 6704, Advances in Metrology for X-Ray and EUV Optics II, 67040C (20 September 2007); doi: 10.1117/12.734816
Show Author Affiliations
Jun Qian, Argonne National Lab. (United States)
Lahsen Assoufid, Argonne National Lab. (United States)
Albert Macrander, Argonne National Lab. (United States)


Published in SPIE Proceedings Vol. 6704:
Advances in Metrology for X-Ray and EUV Optics II
Lahsen Assoufid; Peter Z. Takacs; Masaru Ohtsuka, Editor(s)

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