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Proceedings Paper

Investigation of TlBr detector response under high-flux x-rays
Author(s): Hadong Kim; Leonard Cirignano; Yuri Dmitriev; Mike Squillante; Philip Wong; Kanai Shah
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Paper Abstract

Thallium bromide (TlBr) is a compound semiconductor with high density, high atomic numbers and wide bandgap. In addition, recent results indicate that the mobility-lifetime product of electrons can be quite high, approaching the values for CdTe and CZT. These properties make TlBr a very promising material for nuclear radiation detector at room temperature. In this paper we report on our investigation of the performance of planar TlBr detector under high flux x-rays irradiation. This study proposes an alternate contact method that reduces the polarization effects, and the afterglow for a wide range of high flux applications.

Paper Details

Date Published: 24 September 2007
PDF: 9 pages
Proc. SPIE 6706, Hard X-Ray and Gamma-Ray Detector Physics IX, 67061F (24 September 2007); doi: 10.1117/12.734779
Show Author Affiliations
Hadong Kim, Radiation Monitoring Devices, Inc. (United States)
Leonard Cirignano, Radiation Monitoring Devices, Inc. (United States)
Yuri Dmitriev, Radiation Monitoring Devices, Inc. (United States)
Mike Squillante, Radiation Monitoring Devices, Inc. (United States)
Philip Wong, Radiation Monitoring Devices, Inc. (United States)
Kanai Shah, Radiation Monitoring Devices, Inc. (United States)


Published in SPIE Proceedings Vol. 6706:
Hard X-Ray and Gamma-Ray Detector Physics IX
Ralph B. James; Arnold Burger; Larry A. Franks, Editor(s)

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