Share Email Print
cover

Proceedings Paper

Vapor-phase-deposited organosilane coatings as hardening agents for high-peak-power laser optics
Author(s): K. L. Marshall; Z. Culakova; B. Ashe; C. Giacofei; A. L. Rigatti; T. J. Kessler; A. W. Schmid; J. B. Oliver; A. Kozlov
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Multilayer-dielectric (MLD) diffraction gratings are used in high-power laser systems to compress laser-energy pulses. The peak power deliverable on target for these short-pulse petawatt class systems is limited by the laser-damage resistance of the optical components in the system, especially the MLD gratings. Recent experiments in our laboratory have shown that vapor treatment of MLD gratings at room temperature with organosilanes such as hexamethyldisilazane (HMDS) produces an increase in their damage threshold at 1054 nm (10-ps, 370- μm spot size) as compared to uncoated MLD grating control samples. The 1-on-1 laser-damage threshold of an HMDS-treated grating increased by 4.5% as compared to the uncoated control sample, while the N-on-1 damage threshold of an MLD grating treated with tetramethyldisilazane increased by 16.5%. For an MLD grating treated with bis-(trifluoropropyl)tetramethyldisilazane, the N-on-1 and 1-on-1 damage thresholds increased by 4.8% and 5.3%, respectively. Such increases in laser-damage threshold are unprecedented and counterintuitive because it is widely believed that the presence of organic materials or coatings on the surfaces of optical substrates will inevitably lead to reduced laser-damage resistance.

Paper Details

Date Published: 21 September 2007
PDF: 11 pages
Proc. SPIE 6674, Thin-Film Coatings for Optical Applications IV, 667407 (21 September 2007); doi: 10.1117/12.734723
Show Author Affiliations
K. L. Marshall, Univ. of Rochester (United States)
Z. Culakova, Univ. of Rochester (United States)
B. Ashe, Univ. of Rochester (United States)
C. Giacofei, Univ. of Rochester (United States)
A. L. Rigatti, Univ. of Rochester (United States)
T. J. Kessler, Univ. of Rochester (United States)
A. W. Schmid, Univ. of Rochester (United States)
J. B. Oliver, Univ. of Rochester (United States)
A. Kozlov, Univ. of Rochester (United States)


Published in SPIE Proceedings Vol. 6674:
Thin-Film Coatings for Optical Applications IV
Michael J. Ellison, Editor(s)

© SPIE. Terms of Use
Back to Top