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Proceedings Paper

Calibration of a reversed-wavefront interferometer for polarization coherence metrology
Author(s): Dean P. Brown; Alexis K. Spilman; Thomas G. Brown; Miguel A. Alonso; Riccardo Borghi; Massimo Santarsiero
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Paper Abstract

A reversed-wavefront Young interferometer has recently been proposed and demonstrated for a direct measurement of optical coherence. It relies on the creation of a reversed-wavefront replica of an electromagnetic beam in such a way that the coherence function of the initial beam can be mapped out by simple translation of a pair of pinholes in a Young's interference experiment. The same interferometer can, in principle, be used for polarization-dependent coherence measurements, but presents significant challenges. In this paper, we will describe the calibration of the interferometer and show measurements of the polarization-dependent coherence function of two optical sources.

Paper Details

Date Published: 10 September 2007
PDF: 9 pages
Proc. SPIE 6672, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III, 667207 (10 September 2007); doi: 10.1117/12.734526
Show Author Affiliations
Dean P. Brown, Univ. of Rochester (United States)
Alexis K. Spilman, Univ. of Rochester (United States)
Thomas G. Brown, Univ. of Rochester (United States)
Miguel A. Alonso, Univ. of Rochester (United States)
Riccardo Borghi, Univ. Roma Tre (Italy)
Massimo Santarsiero, Univ. Roma Tre (Italy)


Published in SPIE Proceedings Vol. 6672:
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III
Angela Duparré; Bhanwar Singh; Zu-Han Gu, Editor(s)

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